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Автор J N Andersen
Автор O Bjorneholm
Автор A Stenborg
Автор A Nilsson
Автор C Wigren
Автор N Martensson
Дата выпуска 1989-10-09
dc.description Quantitative information about adhesion and segregation energies in metallic systems can be obtained by means of the binding energy shifts between different layers observed in core-level photoelectron spectroscopy. Layer-dependent Al2p core-level spectra for Al deposited on Mo(110) are presented. The difference in adhesion energy of Al and Si on Mo is found to be 0.24 eV per atom, with the Si-Mo bonding being the stronger one. It is found that the energetics favour a segregation of Si impurities in the Al layer to the Al/Mo interface. These results are shown to be in good agreement with calculations based on Miedema's scheme.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Measurement of metal-metal adhesion and interface segregation energies by core-level photoelectron spectroscopy: Al and Si on Mo(110)
Тип paper
DOI 10.1088/0953-8984/1/40/006
Electronic ISSN 1361-648X
Print ISSN 0953-8984
Журнал Journal of Physics: Condensed Matter
Том 1
Первая страница 7309
Последняя страница 7313
Аффилиация J N Andersen; MAX-Lab, Lund Univ., Sweden
Аффилиация O Bjorneholm; MAX-Lab, Lund Univ., Sweden
Аффилиация A Stenborg; MAX-Lab, Lund Univ., Sweden
Аффилиация A Nilsson; MAX-Lab, Lund Univ., Sweden
Аффилиация C Wigren; MAX-Lab, Lund Univ., Sweden
Аффилиация N Martensson; MAX-Lab, Lund Univ., Sweden
Выпуск 40

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