| Автор | Fujihira, Masamichi |
| Дата выпуска | 1999 |
| dc.description | ▪ Abstract The electrostatic force microscope is one of many specialized tip sensors used in near-field microscopy. This type of microscope is realized by applying a voltage on a conducting AFM tip. It can be used to image samples that present a distribution of electrical properties on inhomogeneous materials as well as on nanostructures. This microscopy technique has been used to probe phase separation, chemical recognition, molecular orientation, and photo-induced charge separation in molecular photodiodes in Langmuir-Blodgett films. |
| Формат | application.pdf |
| Издатель | Annual Reviews |
| Копирайт | Annual Reviews |
| Название | KELVIN PROBE FORCE MICROSCOPY OF MOLECULAR SURFACES |
| DOI | 10.1146/annurev.matsci.29.1.353 |
| Print ISSN | 0084-6600 |
| Журнал | Annual Review of Materials Science |
| Том | 29 |
| Первая страница | 353 |
| Последняя страница | 380 |
| Аффилиация | Fujihira, Masamichi; Department of Biomolecular Engineering, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 266-8501, Japan; e-mail: mfujihir@bio.titech.ac.jp |
