| Автор | Barbara, P. F. |
| Автор | Adams, D. M. |
| Автор | O'Connor, D. B. |
| Дата выпуска | 1999 |
| dc.description | ▪ Abstract Recent progress on the use of near-field scanning optical microscopy (NSOM) to characterize organic thin film materials is extensively reviewed. NSOM is leading to important new information on the morphology and spatially resolved optical properties of a variety of materials, complementing more widely available methods for thin film analysis. Materials described in this review include polymer thin films, molecular aggregates, molecular crystals, molecular semiconductor heterojunctions, biological materials, and molecular mono-, bi-, and multi-layer films. |
| Формат | application.pdf |
| Издатель | Annual Reviews |
| Копирайт | Annual Reviews |
| Название | CHARACTERIZATION OF ORGANIC THIN FILM MATERIALS WITH NEAR-FIELD SCANNING OPTICAL MICROSCOPY (NSOM) |
| DOI | 10.1146/annurev.matsci.29.1.433 |
| Print ISSN | 0084-6600 |
| Журнал | Annual Review of Materials Science |
| Том | 29 |
| Первая страница | 433 |
| Последняя страница | 469 |
| Аффилиация | Barbara, P. F.; Department of Chemistry and Biochemistry, University of Texas at Austin, Austin, Texas 78712; e-mail: P.BARBARA@MAIL.UTEXAS.EDU |
