Conventional Transmission-Electron-Microscopy Techniques in Convergent-Beam Electron Diffraction
TANAKA, Michiyoshi; Department of Physics, Faculty of Science, Tohoku UniversitySendai, 980 Japan
Журнал:
Journal of Electron Microscopy
Дата:
1986
Аннотация:
Convergent-beam electron diffraction (CBED) is quite an effective method for the determination of crystal point groups and space groups and for the identification of the nature of crystal lattice defects and interfaces. Three important techniques In the conventional transmission electron microscope method (CFEM) of CBED are reviewed: the large angle technique, hollow- cone beam technique and simultaneous observation technique of zone-axis- and ±G dark-field-patterns. It is shown that the crystal symmetries and the nature of lattice defects can be easily and clearly Identified by these techniques.
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