Chapter 2. Scanning Transmission Electron Microscopy
Lupini, A.R.; Rashkeev, S.N.; Varela, M.; Borisevich, A.Y.; Oxley, M.P.; van Benthem, K.; Peng, Y.; de Jonge, N.; Veith, G.M.; Pantelides, S.T.; Chisholm, M.F.; Pennycook, S.J.; Lupini A.R.; Materials Science and Technology Division; Rashkeev S.N.; Materials Science and Technology Division; Varela M.; Materials Science and Technology Division; Borisevich A.Y.; Materials Science and Technology Division; Oxley M.P.; Materials Science and Technology Division; van Benthem K.; Materials Science and Technology Division; Peng Y.; Materials Science and Technology Division; de Jonge N.; Materials Science and Technology Division; Veith G.M.; Materials Science and Technology Division; Pantelides S.T.; Materials Science and Technology Division; Chisholm M.F.; Materials Science and Technology Division; Pennycook S.J.; Materials Science and Technology Division
Журнал:
Nanocharacterisation
Дата:
2007
975.6Кб