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Автор Brydson, R.
Дата выпуска 2007
ISBN 978-0-85404-241-8
Формат application.pdf
Издатель Royal Society of Chemistry
Название Chapter 4. Electron Energy-loss Spectroscopy and Energy Dispersive X-Ray Analysis
Тип other
DOI 10.1039/9781847557926-00094
Print ISSN 1757-7136
Журнал Nanocharacterisation
Первая страница 94
Последняя страница 137
Аффилиация Brydson R.; Leeds Electron Microscopy and Spectroscopy Centre, Institute for Materials Research, SPEME, University of Leeds
Библиографическая ссылка J. Höhne, M. Bühler, T. Hertuch, U. Hess, High Resolution X-Ray Spectrometers for Materials Analysis, Inst. Phys. Conf. Ser., 1999, 161, 249
Библиографическая ссылка S.J. Pennycook, A.J. Craven, L.M. Brown, Cathodoluminescence on a Scanning Transmission Electron Microscope, Inst. Phys. Conf. Ser., 1977, 36, 69
Библиографическая ссылка P.C. Tiemeiger, Operation Modes of a TEM Monochromator, Inst. Phys. Conf. Ser., 1999, 161, 249
Библиографическая ссылка V.J. Keast, A.J. Scott, R. Brydson, D.B. Williams, J. Bruley, Electron Energy Loss Near Edge Structure â a Tool for the Investigation of Electronic Structure on the Nanometre Scale, J. Microsc., 2001, 203, 135, 175
Библиографическая ссылка X. Li, Z. Dong, G. Yuan, A. Brown, A. Westwood, R. Brydson, B. Rand, The Synthesis and Characterisation of Transition Metal Carbide Nanophases using Molten Salts, Proc. carbon 2006, Extended Abstract, 2006, 11C4
Библиографическая ссылка Y. Pan, A. Brown, R. Brydson, A. Warley, A. Li, J. Powell, Electron Beam Damage Studies of Synthetic 6-line Ferrihydrite and Ferritin Molecule Cores EWthin a Human Liver Biopsy, Micron, 2006, 37, 403, 411
Библиографическая ссылка H. Daniels, A. Brown, R. Brydson, B. Rand, Investigating the Graphitization of Carbon using Analytical FEGTEM, Inst. Phys. Conf. Ser., 2003, 179, 27
Библиографическая ссылка H. Daniels, A. Brown, R. Brydson, B. Rand, Quantitative Valence Plasmon Mapping in the TEM: Viewing Physical Properties at the Nanoscale, Ultramicroscopy, 2003, 96, 547, 558
Библиографическая ссылка I.G. Richardson, A. Brough, R. Brydson, G.W. Groves, C.M. Dobson, The Location of Aluminium in Substituted Calcium Silicate Hydrate Gels as Determined by <sup>29</sup>Si and <sup>27</sup>Al NMR and EELS, J. Am. Ceram. Soc., 1993, 76, 2285, 2288
Библиографическая ссылка L.A.J. Garvie, A.J. Craven, R. Brydson, The Use of Electron Energy Loss Near-Edge Structure in the Study of Minerals, Amer. Min., 1994, 79, 411
Библиографическая ссылка A. Brown, R. Brydson, R. Jugdaohsingh, A. Bleloch, K. White, C. McCrohan, R. Walton, J. Powell, Analytical Electron Microscopy of the Earliest Identified Alumino-silicates: from Dilute Solutions to Freshwater Snails, Proceedings of International Microscopy Congress IMC16, 2006, 1, 1895
Библиографическая ссылка A.J. Scott, R. Brydson, M. MacKenzie, A.J. Craven, A Theoretical Investigation of the ELNES of Transition Metal Carbides and Nitrides for the Extraction of Structural and Bonding Information, Phys. Rev. B, 2001, 63, 245105
Библиографическая ссылка C.C. Calvert, A. Brown, R. Brydson, Determination of the Local Chemistry of Iron in Inorganic and Organic Materials, J. Electron Spectrosc. Relat. Phenom., 2005, 143, 173
Библиографическая ссылка C. Scheu, G. Dehm, G. Mobus, M. Ruhle, R. Brydson, Electron Energy-Loss Spectroscopic Studies of Copper/Alumina Interfaces Grown by MBE, Philos. Mag. A, 1998, 78, 439, 465
Библиографическая ссылка H. Daniels, A. Brown, A. Scott, T. Nichells, B. Rand, R. Brydson, Experimental and Theoretical Evidence for the Magic Angle in Transmission Electron Energy-Loss Spectroscopy, Ultramicroscopy, 2003, 96, 523, 534
Библиографическая ссылка S. McBride, R. Brydson, Analytical TEM and Surface Spectroscopy of Ceramics: The Microstructural Evolution in Titanium-Doped Chromia Polycrystals as a Function of Sintering Conditions, J. Mater. Sci., 2004, 39, 1, 12
Библиографическая ссылка R.F. Egerton, P. Li, M. Malac, Radiation Damage in the TEM and SEM, Micron, 2004, 35, 399, 409
Библиографическая ссылка Z. Aslam, M. Abraham, R. Brydson, A. Brown, B. Rand, Initial Studies Using a Combined TEM-Scanning Tunnelling Microscopy (STM) Side Entry Sample Holder, J. Phys. Conf. Ser., 2006, 26, 54, 58

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