| dc.description |
Small angle x-ray scattering (SAXS) and spectroscopic (IR, UV/VIS) techniques are used to investigate the interaction between titanium dioxide (TiO2) and semiconductor-polymer poly(N-(4-sulfophenyl)aniline (PSA), in poly(N-(4-sulfophenyl) aniline/TiO2 composite (TPSA). Spectroscopic studies indicated the composite formation of TiO2 and PSA. The optical band gap reduction of TiO2 is taking place due to composite formation. Small angle x-ray scattering (SAXS) is used to determine the radius of gyration of cross section (Rc), radius (R) and length (L) of rode-like particle, persistence length (a*), surface fractal dimension (Ds) and PSA layer thickness (E) on TiO2 in aqueous solution and powder form. The results indicate that the aggregation of TiO2 particles upon drying was reduced by formation composite with semiconductor-polymer. Only the particle length of TPSA particle (rod-like shape) increases on drying, probably due to increasing the void sizes as well as formation of aggregation. Persistence length of the TPSA particles decreases with respect to the increase of contact area between solvent and solute, weight of the particles and surface roughness, compared to its individual components. The PSA layer thickness on TiO2 is 3.6 nm and decreases (to 2.6 nm) on dehydration due to the expulsions of water molecules from TiO2/PSA composite. |
