Small-angle electron excitation of H 2p at 54.4 eV
A Z Msezane; Zhifan Chen; A Z Msezane; Dept. of Phys., Clark Atlanta Univ., GA, USA; Zhifan Chen; Dept. of Phys., Clark Atlanta Univ., GA, USA
Журнал:
Journal of Physics B: Atomic, Molecular and Optical Physics
Дата:
1995-02-14
Аннотация:
Various theoretical small-angle electron differential cross sections (DCSs) for excitation of H 2p at 54.4 eV are contrasted through the generalized oscillator strength (GOS) and compared with the GOS from the recent universal function and the only measurement. Near zero scattering angle spread among the results is significant. A curve is established by continuing the measurement through 0 degrees scattering to the optical oscillator strength, which can be used to assess the reliability of both theoretical and experimental small-angle data.
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