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Автор Sheng Wei-dong
Автор Xia Jian-bai
Дата выпуска 1996-09-01
dc.description We have conducted numerical studies of ballistic electron transport in a semiconductor II-structure when an external transverse electric field is applied. The device conductance as a function of electron energy and the strength of the transverse electric field is calculated on the basis of tight-binding Green's function formalism. The calculations show that a relatively weak electric field can induce very large decrease in the electron transmission across the structure. When the transverse electric field is sufficiently strong, electrons can hardly be transported through the device. Thus the performance of the device can be greatly improved for it is much easier to control electron transport through the device with an external transverse electric field.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Suppression of ballistic electron transmission through a semiconductor II-structure by an external transverse electric field
Тип paper
DOI 10.1088/1004-423X/5/9/008
Print ISSN 1004-423X
Журнал Acta Physica Sinica (Overseas Edition)
Том 5
Первая страница 700
Последняя страница 704
Аффилиация Sheng Wei-dong; State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Academia Sinica, Beijing 100083, China
Аффилиация Xia Jian-bai; State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Academia Sinica, Beijing 100083, China
Выпуск 9

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