The contributions of substrate multiple scatterings to ultraviolet photoemission spectra from overlayer covered systems are analysed. Using simple examples, the authors illustrate that an important effect of substrate reflection is the channelling of electrons from directions of strong emission into directions of weak emission. Plots of total elastically reflected intensities (TERI) from substrates Al(100), Ni(100), W(110), Ni(111) and Pt(111) are presented. The relation between LEED TERI plots of substrates and phi -dependences of angle-resolved photoemission spectra is discussed.