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Автор F Mila
Автор C Noguera
Дата выпуска 1987-09-10
dc.description An analytic expression for the current detected in an extended energy loss fine structure experiment in the reflection mode is derived, which takes into account the diffraction by the atoms of the crystal of the two electrons participating in the excitation process. Within a single-scattering approximation, the authors show that the signal contains two oscillating factors, one of the EXAFS type and the other, which has been neglected in all studies until now, similar to a photo-electron diffraction signal. They perform a model computation in order to show the experimental conditions in which an EXAFS-type analysis still applies and the precision in the distances that may be expected. They also propose a new type of experiment in which the detection is angularly resolved and which would allow a bond angle determination in addition to the distance determination, under specified excitation conditions.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Theory of extended energy loss fine structure in the reflection mode
Тип paper
DOI 10.1088/0022-3719/20/25/014
Print ISSN 0022-3719
Журнал Journal of Physics C: Solid State Physics
Том 20
Первая страница 3863
Последняя страница 3873
Аффилиация F Mila; DPhG-SPAS, CENS, Gif-sur-Yvette, France
Аффилиация C Noguera; DPhG-SPAS, CENS, Gif-sur-Yvette, France
Выпуск 25

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