Magnification in the field-ion microscope
J M Walls; H N Southworth; J M Walls; Dept. of Phys., Loughborough Univ. of Technol., Loughborough, UK; H N Southworth; Dept. of Phys., Loughborough Univ. of Technol., Loughborough, UK
Журнал:
Journal of Physics D: Applied Physics
Дата:
1979-05-14
Аннотация:
A number of fundamental definitions of magnification in the field-ion microscope are derived in terms of parameters determined by the projection geometry. These expressions for magnification are then compared with analogous ones derived using an empirical approach. The precise dependence of magnification on emitter radius is discussed, and a particular example of an asymmetric emitter is worked through in detail.
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