| Автор | Y H Siew |
| Автор | J E Aubrey |
| Дата выпуска | 1985-09-14 |
| dc.description | The size-dependent transverse electric field ratio (i.e. transverse field to longitudinal field, or simply tan alpha ) of zinc was measured by an improved virtual probe method at 77K. The reliability of the measurement was checked by measuring the electrical anisotropy of resistivity of a 60 degrees orientated sample and by measuring the tan alpha of a 0 degrees and 90 degrees oriented sample. The inverse proportion of tan alpha with respect to sample thickness found at 77K can be explained in terms of a diffusion size effect model. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | The transverse electric fields in zinc |
| Тип | paper |
| DOI | 10.1088/0022-3727/18/9/005 |
| Electronic ISSN | 1361-6463 |
| Print ISSN | 0022-3727 |
| Журнал | Journal of Physics D: Applied Physics |
| Том | 18 |
| Первая страница | 1735 |
| Последняя страница | 1743 |
| Аффилиация | Y H Siew; Dept. of Phys., Electron. & Electr. Eng., Univ. of Wales Inst. of Sci. & Technol., Cardiff, UK |
| Аффилиация | J E Aubrey; Dept. of Phys., Electron. & Electr. Eng., Univ. of Wales Inst. of Sci. & Technol., Cardiff, UK |
| Выпуск | 9 |
