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Автор S K Chattopadhyay
Автор S K Chatterjee
Автор S P Sen Gupta
Дата выпуска 1989-01-14
dc.description Detailed studies considering the recent developments in the analysis of line shift, line asymmetry and Fourier lineshape have been made on the X-ray diffraction profiles pertaining to the pure copper phase in the composite matrix of Cu and Cu<sub>2</sub>Te (hexagonal) phases in Cu-Te alloys with solute tellurium at 3.30, 5.62, 12.02 and 13.08 wt.%. The microstructural parameters such as the coherent domain sizes, the microstrains within the domains, the intrinsic fault density, alpha ', the extrinsic fault density, alpha " and deformation twin fault density, beta , have been evaluated. While the intrinsic fault density, alpha ', and the extrinsic fault density, alpha ", were found to be absent even at higher solute contents, the deformation twin fault density, beta , which is normally absent in Cu and Cu-base alloy systems, is found to be present here in an appreciable quantity. The reason for the presence of this deformation twin fault in the Cu phase may be attributed to the influence of a neighbouring Cu<sub>2</sub>Te phase in the matrix.
Формат application.pdf
Издатель Institute of Physics Publishing
Название The X-ray diffraction study of deformations in the copper matrix of Cu-Te alloys
Тип paper
DOI 10.1088/0022-3727/22/1/020
Electronic ISSN 1361-6463
Print ISSN 0022-3727
Журнал Journal of Physics D: Applied Physics
Том 22
Первая страница 142
Последняя страница 148
Аффилиация S K Chattopadhyay; Regional Eng. Coll., Durgapur, India
Аффилиация S K Chatterjee; Regional Eng. Coll., Durgapur, India
Аффилиация S P Sen Gupta; Regional Eng. Coll., Durgapur, India
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