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Автор Zhang Yinping
Автор Zhou Chuang
Автор Ge Xinshi
Автор Liang Xingang
Дата выпуска 1992-06-14
dc.description This paper presents a new method (the relative transmission fringe depth (RTFD) method) of determining the optical constants and the thickness of semitransparent thin films. It has the following distinctive features: high precision, simplicity, and a self-examining function for the measured results. In order to meet the needs of application and engineering design, the n-F diagram (F is a new parameter which expresses the relative transmission fringe depth) is drawn. From it, n, k and d of films can be determined conveniently and precisely. With this method, the constants and thicknesses of SnO<sub>2</sub>:I heat mirror coatings, plastic films used in agriculture, and micasheets were determined. The results are in complete agreement with those obtained using a polarimetric meter. Also, the calculated T- lambda curves agree well with the T- lambda curves obtained using a spectrophotometer.
Формат application.pdf
Издатель Institute of Physics Publishing
Название A precise and simple method, the relative transmission fringe depth method, of determining the optical constants and thickness of thin semitransparent films
Тип paper
DOI 10.1088/0022-3727/25/6/018
Electronic ISSN 1361-6463
Print ISSN 0022-3727
Журнал Journal of Physics D: Applied Physics
Том 25
Первая страница 1004
Последняя страница 1009
Аффилиация Zhang Yinping; Dept. of Eng. Thermophys., Univ. of Sci. & Technol. of China, Hefei, China
Аффилиация Zhou Chuang; Dept. of Eng. Thermophys., Univ. of Sci. & Technol. of China, Hefei, China
Аффилиация Ge Xinshi; Dept. of Eng. Thermophys., Univ. of Sci. & Technol. of China, Hefei, China
Аффилиация Liang Xingang; Dept. of Eng. Thermophys., Univ. of Sci. & Technol. of China, Hefei, China
Выпуск 6

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