Автор |
Zhang Yinping |
Автор |
Zhou Chuang |
Автор |
Ge Xinshi |
Автор |
Liang Xingang |
Дата выпуска |
1992-06-14 |
dc.description |
This paper presents a new method (the relative transmission fringe depth (RTFD) method) of determining the optical constants and the thickness of semitransparent thin films. It has the following distinctive features: high precision, simplicity, and a self-examining function for the measured results. In order to meet the needs of application and engineering design, the n-F diagram (F is a new parameter which expresses the relative transmission fringe depth) is drawn. From it, n, k and d of films can be determined conveniently and precisely. With this method, the constants and thicknesses of SnO<sub>2</sub>:I heat mirror coatings, plastic films used in agriculture, and micasheets were determined. The results are in complete agreement with those obtained using a polarimetric meter. Also, the calculated T- lambda curves agree well with the T- lambda curves obtained using a spectrophotometer. |
Формат |
application.pdf |
Издатель |
Institute of Physics Publishing |
Название |
A precise and simple method, the relative transmission fringe depth method, of determining the optical constants and thickness of thin semitransparent films |
Тип |
paper |
DOI |
10.1088/0022-3727/25/6/018 |
Electronic ISSN |
1361-6463 |
Print ISSN |
0022-3727 |
Журнал |
Journal of Physics D: Applied Physics |
Том |
25 |
Первая страница |
1004 |
Последняя страница |
1009 |
Аффилиация |
Zhang Yinping; Dept. of Eng. Thermophys., Univ. of Sci. & Technol. of China, Hefei, China |
Аффилиация |
Zhou Chuang; Dept. of Eng. Thermophys., Univ. of Sci. & Technol. of China, Hefei, China |
Аффилиация |
Ge Xinshi; Dept. of Eng. Thermophys., Univ. of Sci. & Technol. of China, Hefei, China |
Аффилиация |
Liang Xingang; Dept. of Eng. Thermophys., Univ. of Sci. & Technol. of China, Hefei, China |
Выпуск |
6 |