| Автор | J V Champion |
| Автор | S J Dodd |
| Автор | G C Stevens |
| Дата выпуска | 1994-03-14 |
| dc.description | An ultra-sensitive photomultiplier and large-area light collection optics were used with a high-sensitivity charge-coupled device camera to detect and image the long-term light emission behaviour during electrical tree initiation in pin-plane CT200 epoxy resin samples under constant alternating current voltage stress. The observed light emission is interpreted in terms of electroluminescence due to charge injection/extraction at the pin-tip followed by slow material degradation and eventual failure of the metal pin-resin interface. Interface failure is a prelude to formation of microchannels that result in tree initiation. High-resolution charge-coupled device imaging of the electroluminescence reveals that the maximum light emission occurs at the pin-tip and is still observable 10 mu m into the resin. Under long-term continuous electrical stress, the light emission is found to spread principally along the cone of the pin rather than into the resin. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Long-term light emission measurement and imaging during the early stages of electrical breakdown in epoxy resin |
| Тип | paper |
| DOI | 10.1088/0022-3727/27/3/028 |
| Electronic ISSN | 1361-6463 |
| Print ISSN | 0022-3727 |
| Журнал | Journal of Physics D: Applied Physics |
| Том | 27 |
| Первая страница | 604 |
| Последняя страница | 610 |
| Аффилиация | J V Champion; London Univ., UK |
| Аффилиация | S J Dodd; London Univ., UK |
| Аффилиация | G C Stevens; London Univ., UK |
| Выпуск | 3 |
