Мобильная версия

Доступно журналов:

3 288

Доступно статей:

3 891 637

 

Скрыть метаданые

Автор E E Khawaja
Автор S M A Durrani
Автор A B Hallak
Автор M A Salim
Автор M S Hussain
Дата выпуска 1994-05-14
dc.description The density of thin vapour-deposited films of zinc selenide was determined by spectrophotometry combined with Rutherford backscattering spectrometry. Bulk stoichiometry of the films was measured by Rutherford backscattering spectroscopy. It was found that the films were relatively rich in Se. Depth profile study of the films, by x-ray photoelectron spectroscopy, revealed that surfaces were rich in Se while, away from the surface and inside the film, the Se content decreased with depth until the stoichiometric ratio of the compound ZnSe was reached. The density determined was 0.93+or-3% of the bulk value for ZnSe.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Density of thin vapour-deposited films of zinc selenide
Тип paper
DOI 10.1088/0022-3727/27/5/019
Electronic ISSN 1361-6463
Print ISSN 0022-3727
Журнал Journal of Physics D: Applied Physics
Том 27
Первая страница 1008
Последняя страница 1013
Аффилиация E E Khawaja; Energy Res. Div., King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia
Аффилиация S M A Durrani; Energy Res. Div., King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia
Аффилиация A B Hallak; Energy Res. Div., King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia
Аффилиация M A Salim; Energy Res. Div., King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia
Аффилиация M S Hussain; Energy Res. Div., King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia
Выпуск 5

Скрыть метаданые