Мобильная версия

Доступно журналов:

3 288

Доступно статей:

3 891 637

 

Скрыть метаданые

Автор N N Lebedeva
Автор B G Salamov
Автор B G Akinoglu
Автор K R Allakhverdiev
Дата выпуска 1994-06-14
dc.description A device for rapid visualization of electrical and spatial inhomogeneities of a semi-insulating GaAs (p>or=10<sup>6</sup> Omega cm) is described. This visualizer is a modification of the ionization type photographic system in which a semiconducting plate is placed between transparent plane parallel electrodes in the gas discharge cell. The gas discharge gaps are formed between free surfaces of the semiconductor and electrodes. When a voltage is applied to the electrodes a discharge luminescence glows in the gap under uniform infrared illumination of the semiconductor. The uniformity of glowing over the semiconductor area is determined by electrical homogeneity and infrared absorptivity of the material. The main discharge glow patterns on both sides and after chemical etching are similar, which reflects the fact that the structural defects are continuous within the plate. The observed patterns give information about EL2 centres in the GaAs semiconductor. Technical data of the ionization-type visualizer of electrical inhomogeneities in a semiconducting plate are given.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Visualization of electrical inhomogeneities in high-ohmic semiconductor plates by an ionization-type photographic system
Тип paper
DOI 10.1088/0022-3727/27/6/021
Electronic ISSN 1361-6463
Print ISSN 0022-3727
Журнал Journal of Physics D: Applied Physics
Том 27
Первая страница 1229
Последняя страница 1232
Аффилиация N N Lebedeva; State Univ., Baku, Azerbaijan
Аффилиация B G Salamov; State Univ., Baku, Azerbaijan
Аффилиация B G Akinoglu; State Univ., Baku, Azerbaijan
Аффилиация K R Allakhverdiev; State Univ., Baku, Azerbaijan
Выпуск 6

Скрыть метаданые