Highly sensitive measurement of surface charge distribution using the Pockels effect and an image lock-in amplifier
T Kawasaki; T Terashima; Yongchang Zhu; T Takada; T Maeno; T Kawasaki; Musashi Inst. of Technol., Tokyo, Japan; T Terashima; Musashi Inst. of Technol., Tokyo, Japan; Yongchang Zhu; Musashi Inst. of Technol., Tokyo, Japan; T Takada; Musashi Inst. of Technol., Tokyo, Japan; T Maeno; Musashi Inst. of Technol., Tokyo, Japan
Журнал:
Journal of Physics D: Applied Physics
Дата:
1994-08-14
Аннотация:
A visualization and a quantification technique for a latent electric charge image on a dielectric material has been developed by using the Pockels effect and a computer imaging technique. An optical phase modulation technique and a computer image lock-in amplifier technique were used to improve the signal-to-noise ratio. The measurement system has several improved performances; sensitivity of surface change of 1 nC cm<sup>-2</sup>, spatial resolution of 200 mu m and discrimination of charge polarity. The basic principle of advanced electro-optic surface charge measurement is described and the typical surface charge distribution of positive discharge streamer produced by a high impulse voltage (5 kV<sub>peak</sub>) is demonstrated. Also, comparison is made between the modulation method and the non-modulation method.
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