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Автор T Giaddui
Автор K S Forcey
Автор L G Earwaker
Автор A Loni
Автор L T Canham
Автор A Halimaoui
Дата выпуска 1996-06-14
dc.description Ion beam analysis data are presented on both freshly prepared and `aged' porous silicon layers of widely varying (10 - 85%) porosity. Both evaporated Al and PECVD surface capping layers are shown to suppress some of the rapid ion beam induced changes in chemical composition that have been reported during analysis of uncapped layers. Specifically, these capping layers were successful in eliminating carbon and oxygen accumulation within the material but they only slightly reduced hydrogen loss under ion bombardment. Evaporated aluminium surface capping layers were partially successful in suppressing long term ambient oxygen pick-up.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Reduction of ion beam induced and atmospheric ageing of porous silicon using Al and caps
Тип paper
DOI 10.1088/0022-3727/29/6/025
Electronic ISSN 1361-6463
Print ISSN 0022-3727
Журнал Journal of Physics D: Applied Physics
Том 29
Первая страница 1580
Последняя страница 1586
Выпуск 6

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