Автор |
Rik Brydson |
Дата выпуска |
1996-07-14 |
dc.description |
The study of internal interfaces using spatially resolved electron energy loss near-edge structure (ELNES) appears to allow the determination of local atomic environments and valence states of interfacial atomic species via a simple fingerprint formulism. Using the results of multiple scattering theory, this formulism is investigated in depth for the case of diffusion bonded niobium/-alumina interfaces and conclusions are drawn in terms of the available information content. The prospects for employing ELNES as a probe of the medium-range order present at interfaces are also considered. |
Формат |
application.pdf |
Издатель |
Institute of Physics Publishing |
Название |
Multiple scattering theory applied to ELNES of interfaces |
Тип |
paper |
DOI |
10.1088/0022-3727/29/7/004 |
Electronic ISSN |
1361-6463 |
Print ISSN |
0022-3727 |
Журнал |
Journal of Physics D: Applied Physics |
Том |
29 |
Первая страница |
1699 |
Последняя страница |
1708 |
Аффилиация |
Rik Brydson; Department of Materials Science and Engineering, University of Surrey, Guildford, Surrey GU2 5XH, UK |
Выпуск |
7 |