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Автор Pawel Mackowiak
Автор Wlodzimierz Nakwaski
Дата выпуска 1998-10-07
dc.description In the present paper a detailed (but simple from a mathematical point of view) threshold analysis of room-temperature pulse operation of ultraviolet light (UV) emitting GaN/AlGaN/AlN vertical-cavity electrically pumped surface-emitting lasers (VCSELs) is carried out to examine the possible use of this semiconductor injection laser configuration in future mass application. Several VCSEL structures are considered. An index-guided nitride single quantum well (SQW) VCSEL structure ensures the best laser performance, as expected, particularly in the case of small-size devices. But surprisingly, gain-guided SQW VCSELs are found to exhibit comparable thresholds with much simpler double-heterostructure (DH) VCSELs of bulk active regions. Moreover, thresholds of DH nitride VCSELs are proved to be much less sensitive to all optical losses (for example material absorption as well as diffraction, scattering, and end losses) than their SQW counterparts. Therefore the SQW VCSELs need more advanced technology (making possible achievement of lower dislocation densities and/or higher facet reflectivities) to be superior to DH ones.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Detailed threshold analysis of UV-emitting nitride vertical-cavity surface-emitting lasers
Тип paper
DOI 10.1088/0022-3727/31/19/019
Electronic ISSN 1361-6463
Print ISSN 0022-3727
Журнал Journal of Physics D: Applied Physics
Том 31
Первая страница 2479
Последняя страница 2484
Аффилиация Pawel Mackowiak; Institute of Physics, Technical University of ódz ul. Wólczanska 219, 93-005 ódz, Poland
Аффилиация Wlodzimierz Nakwaski; Institute of Physics, Technical University of ódz ul. Wólczanska 219, 93-005 ódz, Poland
Выпуск 19

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