| Автор | Caio M C de Castilho |
| Дата выпуска | 1999-09-07 |
| dc.description | Trajectories of positive ions produced in a region close to a structured surface, modelled by spherical or spheroidal protrusions and kept at a positive electric potential with respect to a distant screen or detector are calculated. The results are discussed in comparison with similar practical situations produced by field ionization and field evaporation or desorption, such as those occurring in gas field ion sources, field ion microscopy and field desorption spectroscopy. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Ion trajectories in atom probe field ion microscopy and gas field ion sources |
| Тип | paper |
| DOI | 10.1088/0022-3727/32/17/317 |
| Electronic ISSN | 1361-6463 |
| Print ISSN | 0022-3727 |
| Журнал | Journal of Physics D: Applied Physics |
| Том | 32 |
| Первая страница | 2261 |
| Последняя страница | 2265 |
| Аффилиация | Caio M C de Castilho; Department of Chemistry, University of Cambridge, Lensfield Road, Cambridge CB3 1EW, UK and Instituto de Física, Universidade Federal da Bahia, Campus Universitário da Federação, 40210 - 340 Salvador, Bahia, Brazil |
| Выпуск | 17 |
