Photoreflectance study of hexagonal CdSe
Akio Kaneta; Sadao Adachi; Akio Kaneta; Department of Electronic Engineering, Faculty of Engineering, Gunma University, Kiryu-shi, Gunma 376-8515, Japan; Sadao Adachi; Department of Electronic Engineering, Faculty of Engineering, Gunma University, Kiryu-shi, Gunma 376-8515, Japan
Журнал:
Journal of Physics D: Applied Physics
Дата:
1999-09-21
Аннотация:
Photoreflectance (PR) spectra have been measured to determine the fundamental-absorption-edge (E<sub>0</sub>) structure of hexagonal CdSe single crystal for both E c and E|| c polarizations at temperatures T between 77 and 300 K. The measured PR spectra are found to be successfully explained by an excitonic line shape for temperatures T below ~200 K and by a three-dimensional one-electron line shape for T>200 K. No clear evidence of the exciton interference effect has been observed within our experimental temperature range T = 77-300 K. The temperature dependence of the E<sub>0</sub>-exciton parameters (exciton energy, amplitude and broadening parameter) has been determined and analysed using the Varshni equation and an empirical expression of Bose-Einstein type.
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