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Автор Nicolas Gherardi
Автор Steve Martin
Автор Françoise Massines
Дата выпуска 2000-10-07
dc.description The aim of this work is to study the properties of a silicon-based deposit realized with a glow dielectric barrier discharge at atmospheric pressure in a nitrogen, silane and nitrous oxide mixture. It is shown that a continuous thin film can be realized. The chemical composition of the thin layer has been determined by x-ray photoelectron spectroscopy and static secondary ion mass spectrometry. The characteristics of the deposit are correlated to those of the discharge. The first steps of a chemical pathway leading to the precursors of the deposit are proposed from the analysis of the optical emission spectrum of the discharge. It appears that, unlike the low-pressure PECVD in a N<sub>2</sub>O-SiH<sub>4</sub> mixture, in an atmospheric-pressure glow discharge NO is the main oxidizing species, due to the action of the metastable nitrogen molecules.
Формат application.pdf
Издатель Institute of Physics Publishing
Название A new approach to SiO<sub>2</sub> deposit using a N<sub>2</sub>-SiH<sub>4</sub>-N<sub>2</sub>O glow dielectric barrier-controlled discharge at atmospheric pressure
Тип lett
DOI 10.1088/0022-3727/33/19/102
Electronic ISSN 1361-6463
Print ISSN 0022-3727
Журнал Journal of Physics D: Applied Physics
Том 33
Первая страница L104
Последняя страница L108
Аффилиация Nicolas Gherardi; Laboratoire de Génie Electrique, Université Paul Sabatier, 118 route de Narbonne, 31062 Toulouse cedex, France
Аффилиация Steve Martin; Laboratoire de Génie Electrique, Université Paul Sabatier, 118 route de Narbonne, 31062 Toulouse cedex, France
Аффилиация Françoise Massines; Laboratoire de Génie Electrique, Université Paul Sabatier, 118 route de Narbonne, 31062 Toulouse cedex, France
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