Extremely low-energy electron diffraction: measurement of intensities
J C Dupuy; L Laydevant; J C Dupuy; Lab. de Phys. Industrielle, Inst. Nat. des Sci. Appl., Villeurbanne, France; L Laydevant; Lab. de Phys. Industrielle, Inst. Nat. des Sci. Appl., Villeurbanne, France
Журнал:
Journal of Physics E: Scientific Instruments
Дата:
1983-03-01
Аннотация:
The low-energy electron diffraction apparatus using a Johansson objective lens allows the intensity-energy spectra for diffracted beams to be obtained under normal incidence or with a little tilting, in the range 0-50 eV. Spots do not move when the primary energy varies, the specular beam is easy to measure under normal incidence, the energy can be directly measured without experimental corrections and the primary beam has a constant flow.
479.4Кб