| Автор | D E Palaith |
| Автор | S K Chang |
| Дата выпуска | 1983-03-01 |
| dc.description | The authors present a substantially improved method of deriving complex electrical permittivities from two-port scattering parameter measurements. The method results in the minimum propagation of measurement errors, thereby establishing a lower bound for errors in the permittivity. Analysis of data from medium and high loss materials is presented as a demonstration of the ideas presented. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Improved accuracy for dielectric data |
| Тип | paper |
| DOI | 10.1088/0022-3735/16/3/014 |
| Print ISSN | 0022-3735 |
| Журнал | Journal of Physics E: Scientific Instruments |
| Том | 16 |
| Первая страница | 227 |
| Последняя страница | 230 |
| Аффилиация | D E Palaith; Schlumberger-Doll Res., Ridgefield, CT, USA |
| Аффилиация | S K Chang; Schlumberger-Doll Res., Ridgefield, CT, USA |
| Выпуск | 3 |
