| Автор | S Myhajlenko |
| Автор | W K Ke |
| Дата выпуска | 1984-03-01 |
| dc.description | The technique of delayed coincidence has been used for the determination of cathodoluminescence lifetimes from various semiconductors. Results are presented of decay measurements performed on silicon (band-edge luminescence) and gallium arsenide (deep-level luminescence). These are 'materials systems' not usually associated with cathodoluminescence assessment techniques. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Time-resolved cathodoluminescence by delayed coincidence |
| Тип | paper |
| DOI | 10.1088/0022-3735/17/3/009 |
| Print ISSN | 0022-3735 |
| Журнал | Journal of Physics E: Scientific Instruments |
| Том | 17 |
| Первая страница | 200 |
| Последняя страница | 203 |
| Аффилиация | S Myhajlenko; Dept. of Electrical Engng., Univ. of Manchester Inst. of Sci. & Technol., Manchester, UK |
| Аффилиация | W K Ke; Dept. of Electrical Engng., Univ. of Manchester Inst. of Sci. & Technol., Manchester, UK |
| Выпуск | 3 |
