A method of measuring heat fluxes across nickel surfaces using the metal oxide on the surface
P L Weickhardt; I M Ritchie; R J Batterham; D G Wood
Журнал:
Journal of Physics E: Scientific Instruments
Дата:
1969-11-01
Аннотация:
The feasibility of using the semiconducting oxide film on a metal surface to measure the heat flux through that surface and to measure the temperature of the surface has been demonstrated for nickel. The output compares favourably with other available heat flux meters.
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