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Автор M M Farooqui
Автор A G R Evans
Дата выпуска 1987-12-01
dc.description The fabrication of capacitive pressure sensors, using silicon integrated circuit processes is described. Polysilicon diaphragms are laid down using the conventional LPCVD technique. A cavity between the polysilicon layer and silicon substrate is created by etching away an intermediate oxide layer. The subsequently sealed cavity with deformable polysilicon membrane decreases in volume with a positive differential pressure between outside and inside. Capacitance changes between an electrode on the membrane and the silicon substrate allow pressure changes to be measured. The batch fabrication technology for microminiature device manufacture is described and electrical characteristics of the devices presented.
Формат application.pdf
Издатель Institute of Physics Publishing
Название A polysilicon-diaphragm-based pressure sensor technology
Тип paper
DOI 10.1088/0022-3735/20/12/007
Print ISSN 0022-3735
Журнал Journal of Physics E: Scientific Instruments
Том 20
Первая страница 1469
Последняя страница 1471
Аффилиация M M Farooqui; Dept. of Electron. & Comput. Sci., Southampton Univ., UK
Аффилиация A G R Evans; Dept. of Electron. & Comput. Sci., Southampton Univ., UK
Выпуск 12

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