In situ absolute intensity calibration of VUV spectrometers
C Breton; C De Michelis; W Hecq; M Mattioli; J Ramette; B Saoutic; C Breton; CEN Cadarache, Paul-lez-Durance, France; C De Michelis; CEN Cadarache, Paul-lez-Durance, France; W Hecq; CEN Cadarache, Paul-lez-Durance, France; M Mattioli; CEN Cadarache, Paul-lez-Durance, France; J Ramette; CEN Cadarache, Paul-lez-Durance, France; B Saoutic; CEN Cadarache, Paul-lez-Durance, France
Журнал:
Journal of Physics E: Scientific Instruments
Дата:
1987-05-01
Аннотация:
Two branching-ratio intensity calibration systems for VUV spectrometers are described. Both of them allow calibration at a single wavelength with a single plasma discharge.
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