| Автор | G V M Williams |
| Автор | H J Trodahl |
| Автор | R H March |
| Дата выпуска | 1988-06-01 |
| dc.description | The authors have developed a very simple and rapid x-ray technique for the characterisation of superlattices. The method relies on continuous photographic recording of diffracted x-rays while scanning the superlattice sample through a small range of angles. They have worked up to the seventh-order diffraction spot with relatively short (1 h) exposures. A series of exposures of increasing duration permits the estimate of relative diffraction spot intensities and ultimately provides a measure of the range of interface roughness and/or intermixing between the layers forming the superlattice. The technique is demonstrated with an evaporated amorphous Ge-SiO superlattice, for which a roughness length of approximately 0.6 nm was found. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Simple photographic method for x-ray diffraction characterisation of superlattices |
| Тип | paper |
| DOI | 10.1088/0022-3735/21/6/017 |
| Print ISSN | 0022-3735 |
| Журнал | Journal of Physics E: Scientific Instruments |
| Том | 21 |
| Первая страница | 601 |
| Последняя страница | 603 |
| Аффилиация | G V M Williams; Victoria Univ., Wellington, New Zealand |
| Аффилиация | H J Trodahl; Victoria Univ., Wellington, New Zealand |
| Аффилиация | R H March; Victoria Univ., Wellington, New Zealand |
| Выпуск | 6 |
