| Автор | A Armigliato |
| Автор | U Valdre |
| Дата выпуска | 1971-11-01 |
| dc.description | Instrumental constants, not included in the manufacturer's handbook for the Siemens Elmiskop 101 electron microscope, are reported. The contents refer to image-to-diffraction and image-to-specimen rotation, magnification and diffraction camera calibration. Comments are also made on the use of the electromagnetic beam tilt for dark field work and on the use of rotating specimen holders. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Instrumental data for the Elmiskop 101 electron microscope |
| Тип | paper |
| DOI | 10.1088/0022-3735/4/11/008 |
| Print ISSN | 0022-3735 |
| Журнал | Journal of Physics E: Scientific Instruments |
| Том | 4 |
| Первая страница | 829 |
| Последняя страница | 832 |
| Аффилиация | A Armigliato; LAMEL-CNR, Bologna, Italy |
| Аффилиация | U Valdre; LAMEL-CNR, Bologna, Italy |
| Выпуск | 11 |
