Dependence of film thickness on the heater geometry in vacuum coating technique
N T Moore; S Chatterji; J W Jeffery; N T Moore; Birkbeck Coll., London, UK; S Chatterji; Birkbeck Coll., London, UK; J W Jeffery; Birkbeck Coll., London, UK
Журнал:
Journal of Physics E: Scientific Instruments
Дата:
1971-12-01
Аннотация:
Measurements of the thickness of evaporated films show marked variations with filament geometry and position of substrate from the values calculated assuming spherical symmetry of evaporation.
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