Measurement of deposition rate in matrix spectroscopy with a small laser
P Groner; I Stolkin; Hs H Gunthard; P Groner; Swiss Federal Inst. Technol., Zurich, Switzerland; I Stolkin; Swiss Federal Inst. Technol., Zurich, Switzerland; Hs H Gunthard; Swiss Federal Inst. Technol., Zurich, Switzerland
Журнал:
Journal of Physics E: Scientific Instruments
Дата:
1973-02-01
Аннотация:
A set-up is reported for measurement of the deposition rate of transparent matrix materials typically used in matrix isolation spectroscopy. Its main features consist in measurement of intensity of interference fringes produced by the growing matrix layer on the light of a small laser by a simple power meter. A typical example for an Ar matrix is shown.
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