| Автор | E H Darlington |
| Автор | T G Sparrow |
| Дата выпуска | 1975-07-01 |
| dc.description | A homogeneous field sector analyser of simple design giving first order double focusing and with 90 degrees deflection is described. Constructed for use with the Cavendish high voltage electron microscope for beam energies up to 750 keV, it has a theoretical resolution of 9 eV with a 10 mu m selecting slit and aberration less than 0.3 mu m. An electrostatic deflection system is included to provide for the scanning of small energy changes and to enable compensation of periodic fluctuations such as 50 Hz modulation. The analyser is a convenient way of examining the quality of the HT supply. The full width at half maximum of the beam energy spectrum was found to be 80+or-5 eV at 300, 500 and 700 keV and this has now been improved to 40 eV using the analyser as a monitor. Characteristic (inner shell ionization) losses can be readily detected from specimens much thicker than those used at normal microscope voltages. To date, K losses from boron to copper, L losses from nickel, copper and silver, and M losses from silver have been detected. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | A magnetic prism spectrometer for a high voltage electron microscope |
| Тип | paper |
| DOI | 10.1088/0022-3735/8/7/018 |
| Print ISSN | 0022-3735 |
| Журнал | Journal of Physics E: Scientific Instruments |
| Том | 8 |
| Первая страница | 596 |
| Последняя страница | 600 |
| Аффилиация | E H Darlington; Cavendish Lab., Univ. of Cambridge, Cambridge, UK |
| Аффилиация | T G Sparrow; Cavendish Lab., Univ. of Cambridge, Cambridge, UK |
| Выпуск | 7 |
