Автор |
G J Gillen |
Автор |
A T Elliott |
Дата выпуска |
1992-12-01 |
dc.description |
The accuracy of the analogue to digital conversion (ADC) process is a critical element in the production of high quality SPECT images. Sub-optimal ADC performance can lead to the production of non-uniformities in the projection data which are amplified by the reconstruction process to produce circular artefacts in the transaxial sections. A simple method for the objective, quantitative assessment of ADC differential linearity has been developed. The analytical approach uses the fact that a differential non-linearity in the ADC will produce a non-uniformity in the digitized image which has a well defined periodicity. This can be most clearly demonstrated in the frequency space domain by determining the Fourier transform of a thick profile which is taken through the centre of a flood field image. The accuracy of the method permits deteriorations in the performance of ADCs to be detected well before significant reduction in SPECT image quality are produced. |
Формат |
application.pdf |
Издатель |
Institute of Physics Publishing |
Название |
Quality control of analogue to digital conversion circuitry for artefact-free SPECT imaging |
Тип |
paper |
DOI |
10.1088/0031-9155/37/12/002 |
Electronic ISSN |
1361-6560 |
Print ISSN |
0031-9155 |
Журнал |
Physics in Medicine and Biology |
Том |
37 |
Первая страница |
2175 |
Последняя страница |
2188 |
Аффилиация |
G J Gillen; West of Scotland Health Boards, Dept. of Clinical Phys. & Bioeng., Glasgow, UK |
Аффилиация |
A T Elliott; West of Scotland Health Boards, Dept. of Clinical Phys. & Bioeng., Glasgow, UK |
Выпуск |
12 |