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Автор G J Gillen
Автор A T Elliott
Дата выпуска 1992-12-01
dc.description The accuracy of the analogue to digital conversion (ADC) process is a critical element in the production of high quality SPECT images. Sub-optimal ADC performance can lead to the production of non-uniformities in the projection data which are amplified by the reconstruction process to produce circular artefacts in the transaxial sections. A simple method for the objective, quantitative assessment of ADC differential linearity has been developed. The analytical approach uses the fact that a differential non-linearity in the ADC will produce a non-uniformity in the digitized image which has a well defined periodicity. This can be most clearly demonstrated in the frequency space domain by determining the Fourier transform of a thick profile which is taken through the centre of a flood field image. The accuracy of the method permits deteriorations in the performance of ADCs to be detected well before significant reduction in SPECT image quality are produced.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Quality control of analogue to digital conversion circuitry for artefact-free SPECT imaging
Тип paper
DOI 10.1088/0031-9155/37/12/002
Electronic ISSN 1361-6560
Print ISSN 0031-9155
Журнал Physics in Medicine and Biology
Том 37
Первая страница 2175
Последняя страница 2188
Аффилиация G J Gillen; West of Scotland Health Boards, Dept. of Clinical Phys. & Bioeng., Glasgow, UK
Аффилиация A T Elliott; West of Scotland Health Boards, Dept. of Clinical Phys. & Bioeng., Glasgow, UK
Выпуск 12

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