Мобильная версия

Доступно журналов:

3 288

Доступно статей:

3 891 637

 

Скрыть метаданые

Автор Salvador Rodríguez
Автор Juan A López-Villanueva
Автор P Cartujo
Автор J E Carceller
Дата выпуска 2000-02-01
dc.description We have studied the importance of the average inversion-layer penetration, which is termed the inversion-layer centroid, to the depletion and inversion charge of a general p-MOS structure. From the quantum theory, and using the Luttinger Hamiltonian, which takes into account the main features of the valence band (degeneracy at k = 0 , split-off influence and warping in the k<sub>x</sub> -k<sub>y</sub> plane), we self-consistently solve the Poisson and Schrödinger equations and thus obtain the hole distribution under various doping levels and external applied voltages. In this way we can numerically determine the centroid and we compare it with the usual empirical expressions. Furthermore, we propose new closed-form expressions to model the centroid for a wide range of technological variables. We also study the influence of the centroid on the surface potential, depletion charge and inversion charge, showing the way in which classical expressions should be modified to take the centroid into account and to model these magnitudes more accurately.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Semiempirical closed-form models for the inversion-layer centroid of a p-MOS including quantum effects
Тип paper
DOI 10.1088/0268-1242/15/2/301
Electronic ISSN 1361-6641
Print ISSN 0268-1242
Журнал Semiconductor Science and Technology
Том 15
Первая страница 85
Последняя страница 90
Аффилиация Salvador Rodríguez; Departamento de Electrónica y Tecnología de Computadores, Facultad de Ciencias, Universidad de Granada, 18071 Granada, Spain
Аффилиация Juan A López-Villanueva; Departamento de Electrónica y Tecnología de Computadores, Facultad de Ciencias, Universidad de Granada, 18071 Granada, Spain
Аффилиация P Cartujo; Departamento de Electrónica y Tecnología de Computadores, Facultad de Ciencias, Universidad de Granada, 18071 Granada, Spain
Аффилиация J E Carceller; Departamento de Electrónica y Tecnología de Computadores, Facultad de Ciencias, Universidad de Granada, 18071 Granada, Spain
Выпуск 2

Скрыть метаданые