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Автор D E Lacklison
Автор J J Harris
Автор C T Foxon
Автор J Hewett
Автор D Hilton
Автор C Roberts
Дата выпуска 1988-07-01
dc.description The authors have studied the temperature, exposure time and wavelength dependence of the photo-conduction processes in thick Si-doped Al<sub>0.33</sub>Ga<sub>0.67</sub>As layers, and also in 2DEG samples with the same (Al, Ga)As composition, with and without a GaAs capping layer. They have deduced the spectral dependence of the photo-ionisation cross section for the Si-related DX centre in the (Al, Ga)As, and used this to model the expected persistent photo-conduction (PPC) behaviour of the 2DEG samples. Although good agreement has been obtained for a restricted range of experimental conditions, significant differences have also been found between the predicted and observed PPC effects, and also between the behaviour of capped and uncapped 2DEG samples. Other inconsistencies have been found, in the decay rate of the PPC on warming the sample and in the number of carriers that can ultimately transfer to the 2DEG channel, which suggest that the ionisation and capture processes for the DX centres in a 2DEG structure are modified from those in bulk (Al, Ga)As.
Формат application.pdf
Издатель Institute of Physics Publishing
Название A comparison of photoconduction effects in (Al, Ga)As and GaAs/(Al, Ga)As heterostructures
Тип paper
DOI 10.1088/0268-1242/3/7/002
Electronic ISSN 1361-6641
Print ISSN 0268-1242
Журнал Semiconductor Science and Technology
Том 3
Первая страница 633
Последняя страница 640
Аффилиация D E Lacklison; Philips Res. Labs., Redhill, UK
Аффилиация J J Harris; Philips Res. Labs., Redhill, UK
Аффилиация C T Foxon; Philips Res. Labs., Redhill, UK
Аффилиация J Hewett; Philips Res. Labs., Redhill, UK
Аффилиация D Hilton; Philips Res. Labs., Redhill, UK
Аффилиация C Roberts; Philips Res. Labs., Redhill, UK
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