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Автор J E M Haverkort
Автор M P Schuwer
Автор M R Leys
Автор J H Wolter
Дата выпуска 1992-01-01
dc.description The authors have investigated spatially resolved photoluminescence spectra around several alpha - and lambda -type oval defects in GaAs/AlGaAs multiple-quantum-well structures. In their low-temperature photoluminescence set-up they combine a high spectral resolution with a 2 mu m spot size on the sample. In the alpha -type defects the authors observe a 25-45 meV low-energy tail of the main quantum well recombination peak near the core of the oval defect as well as an approximately 1 meV line broadening originating from two regions which are symmetrically located at either side of the (110) symmetry axis of the defect. These line-broadening effects are explained by vertical growth rate variations within the oval defect.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Spatial variations of photoluminescence line broadening around oval defects in GaAs/AlGaAs multiple quantum wells
Тип paper
DOI 10.1088/0268-1242/7/1A/011
Electronic ISSN 1361-6641
Print ISSN 0268-1242
Журнал Semiconductor Science and Technology
Том 7
Первая страница A59
Последняя страница A62
Аффилиация J E M Haverkort; Dept. of Phys., Eindhoven Univ. of Technol., Netherlands
Аффилиация M P Schuwer; Dept. of Phys., Eindhoven Univ. of Technol., Netherlands
Аффилиация M R Leys; Dept. of Phys., Eindhoven Univ. of Technol., Netherlands
Аффилиация J H Wolter; Dept. of Phys., Eindhoven Univ. of Technol., Netherlands
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