Thickness effects and the T<sup>2</sup> dependence of the resistivity of aluminium
J R Sambles; K C Elsom; J R Sambles; Dept. of Phys., Exeter Univ., UK; K C Elsom; Dept. of Phys., Exeter Univ., UK
Журнал:
Journal of Physics F: Metal Physics
Дата:
1985-01-01
Аннотация:
A collation of data on the resistivity of aluminium foils is presented. The T<sup>2</sup> term caused by the surface, which is now well established, is examined and found to exist over a large range in sample thickness and observational temperature. Contrary to previous assertions, the magnitude of this T<sup>2</sup> term does not appear to vary simply as the inverse of the sample thickness. It is suggested that there are two ways in which a surface-caused T<sup>2</sup>-like term may arise. In metals with simple Fermi surfaces conventional surface scattering theories yield such a term from a combination of a bulk T<sup>5</sup> term and surface scattering. By contrast, for a metal such as aluminium with a disconnected Fermi surface an extra T<sup>2</sup> term arising directly from surface scattering processes may appear.
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