| Автор | J W C de Vries |
| Дата выпуска | 1987-12-01 |
| dc.description | The resistivity of gold films with thicknesses between 18 and 52 nm is measured from 4.2 to 310 K. The effect of the deposition of thin (1.5 mm) gold layers on top of these films will be discussed. During the deposition and the subsequent resistivity measurements the samples are kept under high vacuum conditions inside the evaporation chamber, thereby prohibiting gas adsorption. It is shown that top layers quench-condensed at 30 K lead to deviations from Matthiessen's rule and to an increase in the resistivity which is attributed to an increased surface roughness. Room temperature deposition leads to a similar surface-induced resistivity increase, but no deviation from Matthiessen's rule is observed. The difference between these two situations is attributed to the fact that in the 30 K? film the top layer is amorphous and hence does not contribute to the conductivity. In films with top layers deposited at room temperature the top layer assumes the structure of the base layer and the conduction occurs in the whole film. In both cases the surface scattering increases by only a small amount. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Surface scattering in thin evaporated gold double layers studied by in situ resistivity measurements |
| Тип | paper |
| DOI | 10.1088/0305-4608/17/12/014 |
| Print ISSN | 0305-4608 |
| Журнал | Journal of Physics F: Metal Physics |
| Том | 17 |
| Первая страница | 2403 |
| Последняя страница | 2409 |
| Аффилиация | J W C de Vries; Philips Res. Labs., Eindhoven, Netherlands |
| Выпуск | 12 |
