The current noise spectrum of copper-doped germanium has been measured from 30 c/s to 16 kc/s and from 5 Mc/s to 50 Mc/s. From the generation-recombination noise level, the capture cross section for holes by the ionized copper atoms is 8.1 × 10^-14 cm²; the high frequency noise spectrum indicates that the carrier lifetime is single valued. In a suitably cleaned crystal no 1/f noise was observed above 30 c/s; excess 1/f noise occurred only when the surface of the crystal was contaminated with a metallic deposit, or a damaged surface layer was present.