| Автор | R B Nicholson |
| Автор | W C Nixon |
| Автор | D H Warrington |
| Дата выпуска | 1963-11-01 |
| dc.description | The Electron Microscopy and Analysis Group held a Conference on Electron Microscopy at Cambridge from 2nd to 6th July 1963. The Conference included papers on electron optics, instrumentation, specimen preparation techniques and applications to physics and physical metallurgy. The last two sessions were devoted to a Symposium on Radiation Damage. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Conference on Electron Microscopy, Cambridge, July 1963 |
| Тип | note |
| DOI | 10.1088/0508-3443/14/11/301 |
| Print ISSN | 0508-3443 |
| Журнал | British Journal of Applied Physics |
| Том | 14 |
| Первая страница | 733 |
| Последняя страница | 740 |
| Выпуск | 11 |
