| Автор | V E Cosslett |
| Дата выпуска | 1964-01-01 |
| dc.description | The diffusion depths experimentally found for 20 kev electrons in four elements (Al, Cu, Ag, Au) are about twice the values predicted by Archard. The discrepancy is reduced by using recent computations of the transport mean free path in his derivation, but an alternative treatment by Tomlin gives still better agreement. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | The diffusion depth for electrons in solid targets |
| Тип | lett |
| DOI | 10.1088/0508-3443/15/1/122 |
| Print ISSN | 0508-3443 |
| Журнал | British Journal of Applied Physics |
| Том | 15 |
| Первая страница | 107 |
| Последняя страница | 109 |
| Аффилиация | V E Cosslett; Cavendish Laboratory, University of Cambridge |
| Выпуск | 1 |
