| Автор | T J Gallagher |
| Автор | T J Lewis |
| Дата выпуска | 1964-08-01 |
| dc.description | An explanation, based on a statistical model, of the pulse breakdown of liquid argon is reported. The electric strength is strongly dependent on cathode oxidation and the results indicate that positive ions play an important role in the breakdown process. From a series of time lag measurements the formative time to breakdown appears to be about 0.1 μsec while statistical lags greater than 20 μsec have been observed at electric stresses above 1.7 MV cm<sup>-1</sup>. In general, the behaviour of liquid argon under pulse voltages is similar to that found previously for hydrocarbons. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Statistical effects in the breakdown of liquid argon under pulse voltages |
| Тип | paper |
| DOI | 10.1088/0508-3443/15/8/307 |
| Print ISSN | 0508-3443 |
| Журнал | British Journal of Applied Physics |
| Том | 15 |
| Первая страница | 929 |
| Последняя страница | 934 |
| Аффилиация | T J Gallagher; Materials Laboratory, Electrical Engineering Department, Queen Mary College, London |
| Аффилиация | T J Lewis; Materials Laboratory, Electrical Engineering Department, Queen Mary College, London |
| Выпуск | 8 |
