| Автор | A Green |
| Автор | L E J Cowles |
| Дата выпуска | 1960-09-01 |
| dc.description | An apparatus for the accurate determination of the thermal diffusivity of semiconductors, which utilizes the thermoelectric properties of such materials, is described. In its present form, the apparatus can be used between room temperatures and 180° C. The application of the method is illustrated by an experiment using a single-crystal specimen of bismuth telluride. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Measurement of thermal diffusivity of semiconductors by Ångström's method |
| Тип | paper |
| DOI | 10.1088/0950-7671/37/9/310 |
| Print ISSN | 0950-7671 |
| Журнал | Journal of Scientific Instruments |
| Том | 37 |
| Первая страница | 349 |
| Последняя страница | 351 |
| Аффилиация | A Green; Research Laboratories of The General Electric Co. Ltd. Wembley, England |
| Аффилиация | L E J Cowles; Research Laboratories of The General Electric Co. Ltd. Wembley, England |
| Выпуск | 9 |
