A simplified atmosphere controlled specimen holder for an x-ray diffraction goniometer
M A Thompson; G R Mallett; M A Thompson; The Dow Chemical Co., Rocky Flats Division, Denver, Colorado, U.S.A; G R Mallett; The Dow Chemical Co., Rocky Flats Division, Denver, Colorado, U.S.A
Журнал:
Journal of Scientific Instruments
Дата:
1963-06-01
Аннотация:
This specimen holder, made for a Norelco type x-ray diffraction goniometer for solid specimens, maintains a constant controlled atmosphere over the sample. The system is useful in studying the controlled oxidation of metallic surfaces.
82.53Кб