A simple specimen holder for low temperature X-ray intensity studies using a General Electric diffractometer
J H Brady; E C van Reuth; J H Brady; U.S. Navy Marine Engineering Laboratory, Annapolis, Maryland, U.S.A; E C van Reuth; U.S. Navy Marine Engineering Laboratory, Annapolis, Maryland, U.S.A
Журнал:
Journal of Scientific Instruments
Дата:
1966-11-01
Аннотация:
A simple device is described which is suitable for X-ray diffraction intensity studies at temperatures near that of liquid nitrogen. The device enables one to make such a study with little or no loss in beam intensity and with a specimen which is free of frost.
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