| Автор | M F Tompsett |
| Автор | C W B Grigson |
| Дата выпуска | 1966-07-01 |
| dc.description | The problems of high energy glancing-angle electron diffraction are discussed and the design of a diffractometer which largely overcomes them is described. This instrument is a reflection scanning electron diffraction system equipped with loss-electron filtering and two-dimensional scanning of the diffraction pattern. It is able to measure I(β, γ) as a three-dimensional display with an intensity accuracy to ±1%, provided the current exceeds 0.01 pA in the solid angle element, which is 10<sup>-7</sup> steradian in size. Filtering is to 6 ev in a 20 kev beam.The system has produced the first essentially elastic diffraction patterns from bulk grain-oriented and single-crystal materials. Removal of the loss electrons greatly improves contrast. Partial pressure of contamination must be reduced below 5 ntorr for true reflection diffractograms to be obtained. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Reflection scanning electron diffraction with energy filtering |
| Тип | paper |
| DOI | 10.1088/0950-7671/43/7/303 |
| Print ISSN | 0950-7671 |
| Журнал | Journal of Scientific Instruments |
| Том | 43 |
| Первая страница | 430 |
| Последняя страница | 435 |
| Аффилиация | M F Tompsett; Engineering Department, University of Cambridge |
| Аффилиация | C W B Grigson; Engineering Department, University of Cambridge |
| Выпуск | 7 |
